Invention Grant
- Patent Title: Semiconductor device and memory device including the semiconductor device
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Application No.: US15390957Application Date: 2016-12-27
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Publication No.: US10128249B2Publication Date: 2018-11-13
- Inventor: Fumika Akasawa , Hiroki Inoue , Takashi Nakagawa , Yoshiyuki Kurokawa
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Applicant Address: JP
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP
- Agency: Husch Blackwell LLP
- Priority: JP2015-256428 20151228
- Main IPC: H01L27/108
- IPC: H01L27/108 ; H01L21/8242 ; G11C8/08 ; G11C11/405 ; G11C11/4074 ; G11C11/408 ; G11C11/403

Abstract:
To provide a semiconductor device that can reduce power consumption and retain data for a long time and a memory device including the semiconductor device. The semiconductor device includes a word line divider, a memory cell, a first wiring, and a second wiring. The word line divider is electrically connected to the first wiring and the second wiring. The memory cell includes a first transistor with a dual-gate structure. A first gate of the first transistor is electrically connected to the first wiring, and a second gate of the first transistor is electrically connected to the second wiring. The word line divider supplies a high-level potential or a low-level potential to the first wiring and supplies a predetermined potential to the second wiring, whereby a threshold voltage of the first transistor is changed. With such a configuration, a semiconductor device that can reduce power consumption and retain data for a long time is driven.
Public/Granted literature
- US20170186751A1 Semiconductor Device and Memory Device Including the Semiconductor Device Public/Granted day:2017-06-29
Information query
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