Invention Grant
- Patent Title: Three-dimensional shape measuring device and three-dimensional shape measuring method
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Application No.: US14966960Application Date: 2015-12-11
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Publication No.: US10145679B2Publication Date: 2018-12-04
- Inventor: Takahiro Aoki
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2015-002698 20150108
- Main IPC: G01B11/24
- IPC: G01B11/24 ; G06T7/00 ; A61B5/117 ; G06K9/20 ; G06K9/00

Abstract:
A three-dimensional shape measuring device is provided that enables an accuracy in measuring a three-dimensional shape of a subject to be improved even when a relationship between a luminance value and a distance deviates from an ideal point light source model in which the luminance value is inversely proportional to the square of the distance. A biometric authentication device includes a coefficient setting unit that sets a coefficient that is an index of a power in a model expression for making a luminance value of a captured image be proportional to an inverse of the power of a distance from a light source to a measurement point of the luminance value according to a prescribed condition, and a three-dimensional shape measuring unit that measures the three-dimensional shape of the subject according to the luminance value of the captured image and the coefficient.
Public/Granted literature
- US20160202047A1 THREE-DIMENSIONAL SHAPE MEASURING DEVICE AND THREE-DIMENSIONAL SHAPE MEASURING METHOD Public/Granted day:2016-07-14
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