Invention Grant
- Patent Title: Signal feature extracting method and apparatus
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Application No.: US15162982Application Date: 2016-05-24
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Publication No.: US10152574B2Publication Date: 2018-12-11
- Inventor: Chang Soon Park , Ui Kun Kwon , Sang-joon Kim , Seungkeun Yoon , Changmok Choi
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: NSIP Law
- Priority: KR10-2015-0156348 20151109
- Main IPC: G06F19/00
- IPC: G06F19/00 ; A61B5/00 ; A61B5/026 ; H04Q9/00 ; G16H50/20 ; A61B5/0295 ; A61B5/0452 ; A61B5/11 ; A61B5/1455

Abstract:
A signal feature extracting method and apparatus is disclosed. The signal feature extracting apparatus estimates element signals forming an input signal using a signal model to be determined by parameters, and extracts signal features using the estimated element signals. The method of extracting a signal feature including estimating element signals from an input signal, and extracting a signal feature using the estimated element signals, wherein the estimating of the element signals comprises estimating a first element signal of the input signal, and estimating a second element signal based on a waveform of a first intermediate signal, the first intermediate signal being a signal derived from the first element signal eliminated from the input signal.
Public/Granted literature
- US20170132384A1 SIGNAL FEATURE EXTRACTING METHOD AND APPARATUS Public/Granted day:2017-05-11
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