Invention Grant
- Patent Title: Air gap over transistor gate and related method
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Application No.: US15152797Application Date: 2016-05-12
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Publication No.: US10157777B2Publication Date: 2018-12-18
- Inventor: Zhong-Xiang He , Mark D. Jaffe , Randy L. Wolf , Alvin J. Joseph , Brett T. Cucci , Anthony K. Stamper
- Applicant: GLOBALFOUNDRIES INC.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES INC.
- Current Assignee: GLOBALFOUNDRIES INC.
- Current Assignee Address: KY Grand Cayman
- Agency: Hoffman Warnick LLC
- Agent David Cain
- Main IPC: H01L29/00
- IPC: H01L29/00 ; H01L21/768 ; H01L21/02 ; H01L21/311 ; H01L21/3213 ; H01L21/84 ; H01L23/66 ; H01L29/786

Abstract:
A semiconductor device may include a transistor gate in a device layer; an interconnect layer over the device layer; and an air gap extending through the interconnect layer to contact an upper surface of the transistor gate. The air gap provides a mechanism to reduce both on-resistance and off-capacitance for applications using SOI substrates such as radio frequency switches.
Public/Granted literature
- US20170330790A1 AIR GAP OVER TRANSISTOR GATE AND RELATED METHOD Public/Granted day:2017-11-16
Information query
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