Invention Grant
- Patent Title: Cell disturb prevention using a leaker device to reduce excess charge from an electronic device
-
Application No.: US15340682Application Date: 2016-11-01
-
Publication No.: US10163917B2Publication Date: 2018-12-25
- Inventor: Durai Vishak Nirmal Ramaswamy
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: H01L27/11507
- IPC: H01L27/11507 ; G11C11/22 ; H01L27/11504 ; H01L27/11509 ; H01L27/01 ; H01L49/02

Abstract:
Various embodiments comprise apparatuses and methods of forming the apparatuses. In one embodiment, an exemplary apparatus includes a plurality of memory cells. At least a portion of the memory cells have a bottom electrode with each bottom electrode being at least partially electrically isolated from remaining ones of the bottom electrodes. At least one resistive interconnect electrically couples two or more of the bottom electrodes. The resistive interconnect is arranged to discharge at least a portion of excess charge from the two or more bottom electrodes. Additional apparatuses and methods of forming the apparatuses are disclosed.
Public/Granted literature
- US20180122816A1 CELL DISTURB PREVENTION USING A LEAKER DEVICE Public/Granted day:2018-05-03
Information query
IPC分类: