Invention Grant
- Patent Title: Orthodontic diagnostic method
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Application No.: US15529529Application Date: 2015-11-25
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Publication No.: US10165991B2Publication Date: 2019-01-01
- Inventor: Ciamak Abkai , Kai Lindenberg , Björn Ludwig
- Applicant: SIRONA DENTAL SYSTEMS GMBH
- Applicant Address: US PA York
- Assignee: DENTSPLY SIRONA Inc.
- Current Assignee: DENTSPLY SIRONA Inc.
- Current Assignee Address: US PA York
- Agency: Dentsply Sirona Inc.
- Priority: DE102014223967 20141125
- International Application: PCT/EP2015/077594 WO 20151125
- International Announcement: WO2016/083431 WO 20160602
- Main IPC: A61B6/00
- IPC: A61B6/00 ; A61C7/00 ; A61B6/14

Abstract:
The invention relates to an orthodontic diagnostic method wherein at least one initial two-dimensional X-ray image (1) of a first zone (2) of a head (3) is taken. Then at least one three-dimensional X-ray image (4) of a second zone (5) of a dental situation is taken, and the three-dimensional X-ray image (4) is combined with the initial two-dimensional X-ray image (1) using a registration process in order to obtain a full image (8).
Public/Granted literature
- US20170303877A1 ORTHODONTIC DIAGNOSTIC METHOD Public/Granted day:2017-10-26
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