Invention Grant
- Patent Title: Apparatus and method for controlling frequency analysis processing, and sensor module
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Application No.: US15417448Application Date: 2017-01-27
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Publication No.: US10168224B2Publication Date: 2019-01-01
- Inventor: Satoshi Tanabe
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED CO., LTD.
- Current Assignee: FUJITSU LIMITED CO., LTD.
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2016-051625 20160315
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G01J11/00 ; G01J1/02 ; A61B5/024 ; A61B5/00

Abstract:
An apparatus for controlling a frequency analysis processing includes: a memory; and a processor coupled to the memory and configured to execute a fast Fourier transform process that includes performing a fast Fourier transform operation on data of two groups into which sensor data sensed at a first sampling frequency by a sensor is divided, and execute a change process that includes changing, in a case where results of butterfly operations of the fast Fourier transform operation are similar between the two groups, a sampling frequency at which the sensor operates to a second sampling frequency lower than the first sampling frequency.
Public/Granted literature
- US20170268932A1 APPARATUS AND METHOD FOR CONTROLLING FREQUENCY ANALYSIS PROCESSING, AND SENSOR MODULE Public/Granted day:2017-09-21
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