Invention Grant
- Patent Title: Method and device for defect-size evaluation
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Application No.: US14898165Application Date: 2014-05-07
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Publication No.: US10168301B2Publication Date: 2019-01-01
- Inventor: Rainer Böhm , Karl Fendt , Werner Heinrich , Hubert Mooshofer
- Applicant: SIEMENS AKTIENGESELLSCHAFT
- Applicant Address: DE
- Assignee: SIEMENS AKTIENGESELLSCHAFT
- Current Assignee: SIEMENS AKTIENGESELLSCHAFT
- Current Assignee Address: DE
- Agency: Schmeiser, Olsen & Watts LLP.
- Priority: DE102013211616 20130620
- International Application: PCT/EP2014/059318 WO 20140507
- International Announcement: WO2014/202275 WO 20141224
- Main IPC: G01N29/06
- IPC: G01N29/06 ; G01N29/04 ; G01S15/89
Abstract:
A method and a device for defect-size evaluation of defects in a test object in ultrasonic testing is provided. In particular, the method and device also allows systematic determination of defect sizes based on the SAFT method. This is done by simulating defects in a test object on the basis of a defined test scenario, and comparing these simulations with actually recorded measured values.
Public/Granted literature
- US20160209371A1 METHOD AND DEVICE FOR DEFECT-SIZE EVALUATION Public/Granted day:2016-07-21
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