Invention Grant
- Patent Title: Semiconductor apparatus and test system including the same
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Application No.: US14569908Application Date: 2014-12-15
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Publication No.: US10168370B2Publication Date: 2019-01-01
- Inventor: Sang Oh Lim
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si, Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si, Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: KR10-2014-0126883 20140923
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G11C29/56 ; G11C29/26
Abstract:
A semiconductor apparatus includes an input/output pad configured to exchange signals with an external device; a control pad configured to be inputted with a discharge signal from the external device; and a first electrostatic protection unit configured to form an electrostatic discharge path from the input/output pad to a first voltage supply line according to the discharge signal.
Public/Granted literature
- US20160087428A1 SEMICONDUCTOR APPARATUS AND TEST SYSTEM INCLUDING THE SAME Public/Granted day:2016-03-24
Information query
