An electronic device and method of determining an abnormality or a normality of a connecting unit in an electronic device is provided. The electronic device includes an external device connecting unit having a first function connecting unit and a second function connecting unit, wherein the first function connecting unit includes a first identification (first ID) pin configured to detect a connection with an external electronic device, and wherein the second function connecting unit includes a second identification (second ID) pin configured to detect the connection with the external electronic device, and a processor configured to determine that an abnormality occurs in the external device connecting unit when values measured from the first ID pin and the second ID pin satisfy a predetermined condition.