Invention Grant
- Patent Title: Dynamic fault model generation for diagnostics simulation and pattern generation
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Application No.: US15813280Application Date: 2017-11-15
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Publication No.: US10169510B2Publication Date: 2019-01-01
- Inventor: Mary P. Kusko , Gary W. Maier , Franco Motika , Phong T. Tran
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G01R31/3183 ; G06F11/26

Abstract:
Techniques relate to dynamic complex fault model generation for diagnostics simulation and pattern generation. Inline fabrication parametric data is received, and the inline fabrication parametric data is a collection of physical measurements made on a device under test during a manufacturing fabrication of the device under test. A fault model of defects is generated according to the inline fabrication parametric data, where the fault model is based on a physical design of the device under test combined with the inline fabrication parametric data for the device under test. Test patterns are generated based on the fault model and the inline fabrication parametric data, such that the test patterns are configured to test the device under test in order to obtain results that are based on the inline fabrication parametric data. A simulation is run of the device under test using the results and the inline fabrication parametric data.
Public/Granted literature
- US20180075170A1 DYNAMIC FAULT MODEL GENERATION FOR DIAGNOSTICS SIMULATION AND PATTERN GENERATION Public/Granted day:2018-03-15
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