Invention Grant
- Patent Title: Method and device for detecting defects on a display subtrate
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Application No.: US15097918Application Date: 2016-04-13
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Publication No.: US10169855B2Publication Date: 2019-01-01
- Inventor: Zhiqiang Wang , Puguo Zhang , Litao Yang , Yanwei Ren , Kunpeng Zhang
- Applicant: BOE TECHNOLOGY GROUP CO., LTD. , Ordos Yuansheng Optoelectronics Co., Ltd.
- Applicant Address: CN Beijing CN Ordos, Inner Mongolia
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.,Ordos Yuansheng Optoelectronics Co., Ltd.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.,Ordos Yuansheng Optoelectronics Co., Ltd.
- Current Assignee Address: CN Beijing CN Ordos, Inner Mongolia
- Agency: Nath, Goldberg & Meyer
- Agent Joshua B. Goldberg
- Priority: CN201510212374 20150429
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G02B21/00 ; G02B21/24 ; G02F1/13 ; H04N5/235 ; H04N5/247 ; G02B21/36

Abstract:
The present invention provides a detecting device and a detecting method thereof. The detecting device serves to detect defects on the display substrate and comprises: a detecting unit for searching for defects on the display substrate and taking pictures of areas in which the defects are located; and a control unit for comparing and analyzing the pictures sent from the detecting unit to assist the detecting unit to search for the defects on the display substrate, and classifying and counting the pictures of areas in which the defects are located. The detecting device can automatically search for and analyze defects on the display substrate, thereby time for analyzing defects on the display substrate is reduced, and defect analyzing efficiency is improved.
Public/Granted literature
- US20160321794A1 Detecting Device and Detecting Method Thereof Public/Granted day:2016-11-03
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