Invention Grant
- Patent Title: Image inspection apparatus, image inspection method, image inspection program, and computer-readable recording medium and recording device
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Application No.: US15663170Application Date: 2017-07-28
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Publication No.: US10169857B2Publication Date: 2019-01-01
- Inventor: Kenta Imakoga
- Applicant: Keyence Corporation
- Applicant Address: JP Osaka
- Assignee: Keyence Corporation
- Current Assignee: Keyence Corporation
- Current Assignee Address: JP Osaka
- Agency: Kilyk & Bowersox, P.L.L.C.
- Priority: JP2016-174092 20160906
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G06F3/0482 ; G06F3/0484

Abstract:
An image inspection apparatus includes: a parameter setting unit that automatically sets a value of a first parameter among a plurality of image processing parameters; an image generation unit that generates a processed image with each of a plurality of second parameter candidate values obtained by changing a value of a second parameter; a display unit that displays a second parameter candidate list image group in which a plurality of processed images are listed; an image selection unit that receives a selection of any one of the processed images included in the second parameter candidate list image group displayed on the display unit; and a determination unit that outputs a determination result of the visual inspection. The parameter setting unit sets a second parameter candidate value corresponding to the processed image selected by the image selection unit as the second parameter.
Public/Granted literature
Information query