Invention Grant
- Patent Title: Stacked nanowires
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Application No.: US15640766Application Date: 2017-07-03
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Publication No.: US10170331B2Publication Date: 2019-01-01
- Inventor: Zhenxing Bi , Kangguo Cheng , Juntao Li , Xin Miao
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Michael J. Chang, LLC
- Agent Vazken Alexanian
- Main IPC: H01L21/306
- IPC: H01L21/306 ; H01L21/3105 ; H01L29/66 ; H01L29/78 ; H01L29/417 ; H01L29/423 ; H01L21/02 ; H01L29/775 ; H01L21/324 ; H01L29/06

Abstract:
Techniques for producing stacked SiGe nanowires using a condensation process without parasitic Ge nanowires as an undesired by-product. In one aspect, a method of forming SiGe nanowires includes the steps of: forming a stack of alternating Si and SiGe layers on a wafer; patterning fins in the stack; selectively thinning the SiGe layers in the fins such that the Si and SiGe layers give the fins an hourglass shape; burying the fins in an oxide material; and annealing the fins under conditions sufficient to diffuse Ge from the SiGe layers in the fins to the Si layers in the fins to form the SiGe nanowires. A FET device and method for formation thereof are also provided.
Public/Granted literature
- US20170301554A1 Stacked Nanowires Public/Granted day:2017-10-19
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