Invention Grant
- Patent Title: Monolithic 3D integration inter-tier vias insertion scheme and associated layout structure
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Application No.: US15630685Application Date: 2017-06-22
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Publication No.: US10170404B2Publication Date: 2019-01-01
- Inventor: Ta-Pen Guo , Carlos H. Diaz , Jean-Pierre Colinge , Yi-Hsiung Lin
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Haynes and Boone, LLP
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L23/498 ; H01L27/092 ; H01L21/48 ; H01L27/06 ; H01L23/48

Abstract:
A 3D-IC includes a first tier device and a second tier device. The first tier device and the second tier device are vertically stacked together. The first tier device includes a first substrate and a first interconnect structure formed over the first substrate. The second tier device includes a second substrate, a doped region formed in the second substrate, a dummy gate formed over the substrate, and a second interconnect structure formed over the second substrate. The 3D-IC also includes an inter-tier via extends vertically through the second substrate. The inter-tier via has a first end and a second end opposite the first end. The first end of the inter-tier via is coupled to the first interconnect structure. The second end of the inter-tier via is coupled to one of: the doped region, the dummy gate, or the second interconnect structure.
Public/Granted literature
- US20170287826A1 MONOLITHIC 3D INTEGRATION INTER-TIER VIAS INSERTION SCHEME AND ASSOCIATED LAYOUT STRUCTURE Public/Granted day:2017-10-05
Information query
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