Invention Grant
- Patent Title: Method and apparatus for direct transfer of semiconductor device die from a mapped wafer
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Application No.: US15978093Application Date: 2018-05-12
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Publication No.: US10170454B2Publication Date: 2019-01-01
- Inventor: Andrew Huska , Cody Peterson , Clinton Adams , Sean Kupcow
- Applicant: Rohinni, LLC
- Applicant Address: US ID Coeur d'Alene
- Assignee: Rohinni, LLC
- Current Assignee: Rohinni, LLC
- Current Assignee Address: US ID Coeur d'Alene
- Agency: Lee & Hayes, P.C.
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L25/075 ; H01L21/677 ; H01L21/68 ; H01L21/687 ; H01L33/62 ; H01L23/00 ; H01L21/67 ; H01L21/66 ; H01L23/544 ; H01L21/683 ; H01L21/48

Abstract:
A system for performing a direct transfer of a plurality of semiconductor die from a first substrate to a second substrate based on map data of the location of the semiconductor die. A first conveyance mechanism conveys the first substrate. A second conveyance mechanism conveys the second substrate. A transfer mechanism is disposed adjacent to the first conveyance mechanism to effectuate the direct transfer. A controller causes one or more processors to perform operations including: determining positions of the plurality of semiconductor die based at least in part on map data, conveying at least one of the first substrate or the second substrate such that the first substrate, the second substrate, and the transfer mechanism are in a direct transfer position, and activating the transfer mechanism to perform the direct transfer of the plurality of semiconductor die.
Public/Granted literature
- US20180261581A1 METHOD AND APPARATUS FOR DIRECT TRANSFER OF SEMICONDUCTOR DEVICE DIE FROM A MAPPED WAFER Public/Granted day:2018-09-13
Information query
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