Invention Grant
- Patent Title: Semiconductor device including a lateral transistor
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Application No.: US15415958Application Date: 2017-01-26
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Publication No.: US10170615B2Publication Date: 2019-01-01
- Inventor: Franz Hirler , Anton Mauder , Andreas Meiser , Till Schloesser
- Applicant: Infineon Technologies Austria AG
- Applicant Address: AT Villach
- Assignee: Infineon Technologies Austria AG
- Current Assignee: Infineon Technologies Austria AG
- Current Assignee Address: AT Villach
- Agency: Murphy, Bilak & Homiller, PLLC
- Priority: DE102016101679 20160129
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L23/495 ; H01L29/06 ; H01L29/10 ; H01L29/40

Abstract:
A semiconductor device includes a source region and a drain region of a first conductivity type. The source region and the drain region are arranged in a first direction parallel to a first main surface of a semiconductor substrate. The semiconductor device further includes a layer stack having a drift layer of the first conductivity type and a compensation layer of a second conductivity type. The drain region is electrically connected with the drift layer. The semiconductor device also includes a connection region of the second conductivity type extending into the semiconductor substrate, the connection region being electrically connected with the compensation layer, wherein the buried semiconductor portion does not fully overlap with the drift layer.
Public/Granted literature
- US20170222043A1 Semiconductor Device Including a Lateral Transistor Public/Granted day:2017-08-03
Information query
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