An inspection system for inspecting a multiple-fiber connector is provided. The inspection system includes a microscope probe and a probe tip configured to provide an optical path between the microscope probe and the multiple-fiber connector. The probe tip and microscope probe are configured so that the field of view of the microscope probe is sufficiently large to cover a portion of the connector surface encompassing a plurality of the optical fiber endfaces. The system further includes a shifting mechanism operable to shift the field of view of the microscope probe between at least two discrete positions over the connector surface. Each discrete position encompasses a different subset of the multiple optical fiber endfaces and optionally at least one positioning reference. A probe tip and a method of inspection are also provided.