- Patent Title: Methods for manufacturing doubly bent X-ray focusing device, doubly bent X-ray focusing device assembly, doubly bent X-ray spectroscopic device and doubly bent X-ray spectroscopic device assembly
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Application No.: US15712799Application Date: 2017-09-22
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Publication No.: US10175185B2Publication Date: 2019-01-08
- Inventor: Naoki Kawahara
- Applicant: RIGAKU CORPORATION
- Applicant Address: JP Akishima-shi, Tokyo
- Assignee: Rigaku Corporation
- Current Assignee: Rigaku Corporation
- Current Assignee Address: JP Akishima-shi, Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2015-063764 20150326
- Main IPC: G01N23/22
- IPC: G01N23/22 ; G01N23/223 ; G21K1/06 ; G01N23/207
Abstract:
A doubly bent X-ray spectroscopic device (1) according to the present invention includes: a glass plate (3) which is deformed into a shape having a doubly bent surface by being sandwiched between a doubly curved convex surface (21a) of a convex forming die (21) and a doubly curved concave surface (22a), of a concave forming die (22), that matches the doubly curved convex surface (21a), and being heated to a temperature of 400° C. to 600° C.; and a reflection coating (5) configured to reflect X-rays, which is formed on a concave surface (3a) of the deformed glass plate (3).
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