Semiconductor memory apparatus and test method thereof
Abstract:
A semiconductor memory apparatus includes a comparison circuit generating a detection code in response to stored data and expected data, a counting circuit generating a counting code in response to the detection code, a selection code output circuit outputting one of a plurality of expected codes as a selection code in response to a selection signal, and a plurality of signal storage circuits. A comparison result output circuit including a plurality of signal storage circuits which stores a comparison result of a comparison between the counting code and the selection code in one signal storage circuit among the plurality of signal storage circuits according to the selection signal, and a value stored in one signal storage circuit among the plurality of signal storage circuits is output as a result signal in response to an output enable signal.
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