Invention Grant
- Patent Title: Semiconductor memory apparatus and test method thereof
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Application No.: US15843465Application Date: 2017-12-15
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Publication No.: US10176885B2Publication Date: 2019-01-08
- Inventor: Jae Seok Kang
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si, Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si, Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: KR10-2017-0040076 20170329
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C29/38 ; G11C29/36 ; G11C7/22

Abstract:
A semiconductor memory apparatus includes a comparison circuit generating a detection code in response to stored data and expected data, a counting circuit generating a counting code in response to the detection code, a selection code output circuit outputting one of a plurality of expected codes as a selection code in response to a selection signal, and a plurality of signal storage circuits. A comparison result output circuit including a plurality of signal storage circuits which stores a comparison result of a comparison between the counting code and the selection code in one signal storage circuit among the plurality of signal storage circuits according to the selection signal, and a value stored in one signal storage circuit among the plurality of signal storage circuits is output as a result signal in response to an output enable signal.
Public/Granted literature
- US20180286493A1 SEMICONDUCTOR MEMORY APPARATUS AND TEST METHOD THEREOF Public/Granted day:2018-10-04
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