Invention Grant
- Patent Title: Measurement method and apparatus for a residual direct-current component and system
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Application No.: US15664477Application Date: 2017-07-31
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Publication No.: US10177844B2Publication Date: 2019-01-08
- Inventor: Hao Chen , Zhenning Tao
- Applicant: Fujitsu Limited
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: CN201610822048 20160913
- Main IPC: H04B10/079
- IPC: H04B10/079 ; H04B10/61

Abstract:
A measurement method and apparatus for a residual direct-current component and a system where the measurement method for a residual direct-current component includes: selecting a section of data of a first predetermined length from a received signal; performing fast Fourier transform on the selected data to obtain a frequency-domain signal of the data; calculating a power spectrum of the frequency-domain signal of the transformed data; and finding out a maximum peak value of the power spectrum in a frequency offset range, and taking power of the maximum peak value as power of the residual direct-current component. With the embodiments of this disclosure, a residual direct-current component of an optical transmitter may be measured at a receiver end of a coherent optical communication system, thereby avoiding a diagnosis error of a communication network, and improving performance of the communication system.
Public/Granted literature
- US20180076889A1 MEASUREMENT METHOD AND APPARATUS FOR A RESIDUAL DIRECT-CURRENT COMPONENT AND SYSTEM Public/Granted day:2018-03-15
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