Invention Grant
- Patent Title: Machine vision inspection system and method for obtaining an image with an extended depth of field
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Application No.: US15360671Application Date: 2016-11-23
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Publication No.: US10178321B2Publication Date: 2019-01-08
- Inventor: Casey Edward Emtman , Robert Kamil Bryll
- Applicant: Mitutoyo Corporation
- Applicant Address: JP Kanagawa-ken
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kanagawa-ken
- Agency: Seed IP Law Group LLP
- Main IPC: H04N5/235
- IPC: H04N5/235 ; H04N5/232 ; H04N5/225 ; H04N9/04 ; G06T7/00 ; G06T5/00 ; G06T5/20 ; G02F1/33 ; G02B27/00 ; G02B21/24 ; G02B21/36 ; G02F1/29

Abstract:
A method for providing an extended depth of field (EDOF) image includes: Periodically modulating an imaging system focus position at a high frequency; using an image exposure comprising discrete image exposure increments acquired at discrete focus positions during an image integration time comprising a plurality of modulation periods of the focus position; and using strobe operations having controlled timings configured to define a set of evenly spaced focus positions for the image exposure increments. The timings are configured so that adjacent focus positions in the set are acquired at times that are separated by at least one reversal of the direction of change of the focus position during its periodic modulation. This solves practical timing problems that may otherwise prevent obtaining closely spaced discrete image exposure increments during high frequency focus modulation. Deconvolution operations may be used to improve clarity in the resulting EDOF image.
Public/Granted literature
- US20170078549A1 MACHINE VISION INSPECTION SYSTEM AND METHOD FOR OBTAINING AN IMAGE WITH AN EXTENDED DEPTH OF FIELD Public/Granted day:2017-03-16
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