Invention Grant
- Patent Title: Specimen analyzer and specimen analysis method
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Application No.: US15609711Application Date: 2017-05-31
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Publication No.: US10192637B2Publication Date: 2019-01-29
- Inventor: Seiji Takemoto , Takeshi Komoto , Hideki Hirayama , Takashi Yoshida , James Ausdenmoore
- Applicant: Sysmex Corporation
- Applicant Address: JP Kobe-shi
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe-shi
- Agency: Metrolexis Law Group, PLLC
- Main IPC: G06F3/12
- IPC: G06F3/12 ; G16H15/00 ; G06F3/14 ; G01N33/49 ; G01N33/487 ; H04N1/00

Abstract:
This specimen analyzer includes: an analysis unit which analyzes a specimen collected from a subject; a print unit which prints on a print sheet; a display unit which displays an operation screen; and a controller which performs control of causing the print unit to print an analysis result of the analysis unit, and prohibiting the display unit from displaying the analysis result.
Public/Granted literature
- US20180349564A1 Specimen analyzer and specimen analysis method Public/Granted day:2018-12-06
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