Invention Grant
- Patent Title: Charged particle beam device
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Application No.: US15542163Application Date: 2015-12-07
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Publication No.: US10192713B2Publication Date: 2019-01-29
- Inventor: Kiyoshi Yabata , Hideki Kikuchi , Naotomo Maruyama
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2015-003787 20150113
- International Application: PCT/JP2015/084230 WO 20151207
- International Announcement: WO2016/114033 WO 20160721
- Main IPC: H01J37/20
- IPC: H01J37/20 ; H01J37/26

Abstract:
In a side entry type sample holder, vibrations in the radial direction of the sample holder provoke a resolving power decrease in the measurement results. In the present invention, the side entry type sample holder has a stepped portion in the radial direction of an axial portion. The sample stage has a support part contacting the stepped portion in a cylindrical portion capable of moving as one body in the axis direction of the sample holder, and, through the contact between the stepped portion and the support part, a frictional force is generated, opposing the radial direction of the axial portion in the sample holder. In this manner, the vibrations in the radial direction of the sample holder are suppressed, and the resolving power decrease in the measurement results is suppressed.
Public/Granted literature
- US20180269027A1 Charged Particle Beam Device Public/Granted day:2018-09-20
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