Invention Grant
- Patent Title: System and process for roof measurement using imagery
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Application No.: US15943337Application Date: 2018-04-02
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Publication No.: US10197391B2Publication Date: 2019-02-05
- Inventor: Dale R. Thornberry , Chris T. Thornberry , Mark F. Garringer
- Applicant: Pictometry International Corp.
- Applicant Address: US NY Rochester
- Assignee: Pictometry International Corp.
- Current Assignee: Pictometry International Corp.
- Current Assignee Address: US NY Rochester
- Agency: Dunlap Codding, P.C.
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01B11/28 ; G06F17/50 ; G06F3/0481 ; G06T7/62

Abstract:
The present disclosure describes systems and processes, including processes in which first location data is received. Visual access to a first image corresponding to the first location data is provided, the first image including a roof structure of a building. A first computer input capable of signaling a designation from the user of a building roof structure location within the first image is provided. A designation of the building roof structure location within the first image is received. Responsive to receiving the designation of the building roof structure location, a second computer input capable of signaling user-acceptance of the building roof structure location within the first image is provided. Responsive to receiving the user-acceptance confirming the designation of the building roof structure location, visual access to one or more second images corresponding to geographic location coordinates of the building roof structure location is provided.
Public/Granted literature
- US20180224271A1 SYSTEM AND PROCESS FOR ROOF MEASUREMENT USING IMAGERY Public/Granted day:2018-08-09
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