Invention Grant
- Patent Title: Method and system for analyzing spatial measuring data
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Application No.: US15035188Application Date: 2014-08-05
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Publication No.: US10197394B2Publication Date: 2019-02-05
- Inventor: Tal Vagman , Dan Albeck
- Applicant: HEXAGON METROLOGY (ISRAEL) LTD.
- Applicant Address: IL Ramat Hasharon
- Assignee: HEXAGON METROLOGY (ISRAEL) LTD.
- Current Assignee: HEXAGON METROLOGY (ISRAEL) LTD.
- Current Assignee Address: IL Ramat Hasharon
- Agency: Maschoff Brennan
- Priority: EP13005240 20131106
- International Application: PCT/IL2014/050707 WO 20140805
- International Announcement: WO2015/068152 WO 20150514
- Main IPC: G01B21/00
- IPC: G01B21/00 ; G01B21/04

Abstract:
Some embodiments of the invention include a method for analyzing spatial measuring data. The method may include an evaluation process with a multitude of measurement processes that are timely and/or spatially distributed over the elements of a set of one, two or a multitude of basically identical items, the items each having one or more features. In some embodiments, the multitude of measurement processes include at least a first and a second measurements of spatial data by means of at least one sensor system comprising at least one sensor. In some embodiments, each measurement of spatial data comprises providing a sensor reference system for each sensor, and measuring and/or extrapolating one or more spatial values of the features of an item of the set of items by means of the at least one sensor.
Public/Granted literature
- US20160282110A1 METHOD AND SYSTEM FOR ANALYZING SPATIAL MEASURING DATA Public/Granted day:2016-09-29
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