Invention Grant
- Patent Title: Sub-frame mechanism for a tire testing machine
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Application No.: US15793049Application Date: 2017-10-25
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Publication No.: US10197475B2Publication Date: 2019-02-05
- Inventor: Michinari Okabe , Hidenari Ota , Naoyuki Neagari
- Applicant: IHI Corporation , IHI Logistics & Machinery Corporation
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: IHI CORPORATION,IHI LOGISTICS & MACHINERY CORPORATION
- Current Assignee: IHI CORPORATION,IHI LOGISTICS & MACHINERY CORPORATION
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: Rothwell, Figg, Ernst & Manbeck, P.C.
- Priority: JP2016-101649 20160520; JP2016-145451 20160725
- Main IPC: G01M17/02
- IPC: G01M17/02

Abstract:
A tire tester includes a rotary member, a tire support mechanism, and an actuator configured to advance and retreat at least one of the rotary member and the tire support mechanism with respect to the other. The tire support mechanism includes a main frame connected with the actuator, a subframe supporting an axle extending in a second direction orthogonal to a first direction in which the rotary member or the tire support mechanism advances and retreats with the actuator, and movably attached to the main frame such that a distance of the subframe from the main frame decreases and increases in a direction crossing the first direction; and at least one measurement unit provided between the main frame and the subframe.
Public/Granted literature
- US20180045610A1 TIRE TESTER Public/Granted day:2018-02-15
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