Invention Grant
- Patent Title: Device and system for inspection
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Application No.: US15429417Application Date: 2017-02-10
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Publication No.: US10197540B2Publication Date: 2019-02-05
- Inventor: Luca Scaccabarozzi
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Mintz Levin Cohn Ferris Glovsky and Popeo, P.C.
- Main IPC: G01N29/44
- IPC: G01N29/44 ; G01N29/04 ; G01N29/24 ; G01N29/28 ; G01N29/265

Abstract:
This disclosure describes embodiments of a probe assembly and an inspection system for ultrasonic inspection. Designs for the probe assembly package components to fit into a bore of a hollow target. These designs may incorporate electronics to generate waves and to detect a wide selection of anomalies (e.g., transversal crack, longitudinal crack, and volumetric flaws) that can form in the hollow target. The probe assembly provides support structure to manipulate and operate these electronics in the bore. This support structure facilitates communication of signals, e.g., from transducer elements that operate as a phased array. The probe assembly also includes a fluid circulating system and coupling system that permits the probe device to detach and reattach to match the probe device (and other parts of the probe assembly) to the size of the bore. These systems allow for fluid and electrical signals to circulate through the probe assembly.
Public/Granted literature
- US20170153209A1 DEVICE AND SYSTEM FOR INSPECTION Public/Granted day:2017-06-01
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