Invention Grant
- Patent Title: Method and system for performing quality control on a diagnostic analyzer
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Application No.: US15087604Application Date: 2016-03-31
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Publication No.: US10197993B2Publication Date: 2019-02-05
- Inventor: Scott Lesher
- Applicant: Sysmex Corporation
- Applicant Address: JP Hyogo
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Hyogo
- Agency: Brinks Gilson & Lione
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G01N33/86 ; G05B19/41 ; G05B19/418 ; G16H40/40 ; G01N35/00

Abstract:
A method for performing quality control on a diagnostic analyzer includes receiving control measurement values from each of a plurality of diagnostic analyzers. A quality control measurement value is received from a target diagnostic analyzer. The quality control measurement value is compared with statistical criteria associated with the plurality of quality control measurement values received from the plurality of diagnostic analyzers. A comparison result is communicated to a user interface associated with the target diagnostic analyzer.
Public/Granted literature
- US20170285624A1 METHOD AND SYSTEM FOR PERFORMING QUALITY CONTROL ON A DIAGNOSTIC ANALYZER Public/Granted day:2017-10-05
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