Disclosed herein is a test apparatus for a device under test. The test apparatus includes a voltage translator coupled to receive test data from the device under test, over a physical interface, using one of a plurality of I/O standards, with the voltage translator being capable of communication using each of the plurality of I/O standards. A programmable interface is configured to receive the test data from the voltage translator. A bit error rate determination circuit is configured to receive the test data from the programmable interface and to determine a bit error rate of reception of the test data over the physical interface based upon a comparison of the test data to check data.