Invention Grant
- Patent Title: Apparatus and method for supporting computer aided diagnosis (CAD) based on probe speed
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Application No.: US14795027Application Date: 2015-07-09
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Publication No.: US10198668B2Publication Date: 2019-02-05
- Inventor: Seung Woo Ryu , Yeong Kyeong Seong , Kyoung Gu Woo
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Jefferson IP Law, LLP
- Priority: KR10-2014-0090017 20140716
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06T7/00 ; A61B8/08 ; A61B8/00 ; G16H50/20 ; G06K9/46

Abstract:
There is provided an apparatus for supporting Computer Aided Diagnosis (CAD) based on a speed of a probe. The apparatus includes a region of interest (ROI) detector configured to detect an ROI from a current image acquired from a probe; and an ROI classifier configured to determine whether to classify the ROI using a determined state of a speed, and classify the ROI according to a result of the determination.
Public/Granted literature
- US20160019441A1 APPARATUS AND METHOD FOR SUPPORTING COMPUTER AIDED DIAGNOSIS (CAD) BASED ON PROBE SPEED Public/Granted day:2016-01-21
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