Invention Grant
- Patent Title: Method for controlling resistive memory device
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Application No.: US15705226Application Date: 2017-09-14
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Publication No.: US10199101B2Publication Date: 2019-02-05
- Inventor: Koichiro Zaitsu , Takayuki Tsukamoto
- Applicant: TOSHIBA MEMORY CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOSHIBA MEMORY CORPORATION
- Current Assignee: TOSHIBA MEMORY CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Foley & Lardner LLP
- Priority: JP2016-255009 20161228
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C13/00

Abstract:
A method for controlling a resistive memory device is described. The resistive memory device including a memory cell provided between a first interconnection and a second interconnection crossing the first interconnection, and the memory cell transitions reversibly between a first resistance state and a second resistance state. The method includes detecting a first current flowing through a memory cell by applying a first voltage between the first interconnection and the second interconnection; comparing a value of the first current with a first criteria value; and determining whether the memory cell is in the first resistance state or the second resistance state. The method further includes comparing the value of the first current with a second criteria value greater than the first criteria value; and setting a first flag for the memory cell when the value of the first current is greater than the second criteria value.
Public/Granted literature
- US20180182455A1 METHOD FOR CONTROLLING RESISTIVE MEMORY DEVICE Public/Granted day:2018-06-28
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