Invention Grant
- Patent Title: Memory devices with read level calibration
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Application No.: US15669055Application Date: 2017-08-04
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Publication No.: US10199111B1Publication Date: 2019-02-05
- Inventor: Gary F. Besinga , Peng Fei , Michael G. Miller , Roland J. Awusie , Kishore Kumar Muchherla , Renato C. Padilla , Harish R. Singidi , Jung Sheng Hoei , Gianni S. Alsasua
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Perkins Coie LLP
- Main IPC: G11C16/10
- IPC: G11C16/10 ; G11C16/28

Abstract:
Several embodiments of memory devices and systems with read level calibration are disclosed herein. In one embodiment, a memory device includes a controller operably coupled to a main memory having at least one memory region and calibration circuitry. The calibration circuitry is operably coupled to the at least one memory region and is configured to determine a read level offset value corresponding to a read level signal of the at least one memory region. In some embodiments, the calibration circuitry is configured to obtain the read level offset value internal to the main memory. The calibration circuitry is further configured to output the read level offset value to the controller.
Public/Granted literature
- US20190043590A1 MEMORY DEVICES WITH READ LEVEL CALIBRATION Public/Granted day:2019-02-07
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