Invention Grant
- Patent Title: One-time programmable (OTP) memory device for reading multiple fuse bits
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Application No.: US15657494Application Date: 2017-07-24
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Publication No.: US10199118B2Publication Date: 2019-02-05
- Inventor: Sang-Seok Lee , Hyun-Taek Jung
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse P.C.
- Priority: KR10-2016-0133563 20161014
- Main IPC: G11C17/16
- IPC: G11C17/16 ; G11C17/18 ; G11C7/20

Abstract:
A one-time programmable (OTP) memory device includes an OTP cell array, a latch controller, a column selection circuit, and a latch circuit. The OTP cell array includes a plurality of OTP memory cells respectively connected to a plurality of bitlines. The latch controller generates a latch address signal indicating an address that is changed sequentially in an enable mode to initialize the OTP memory device. The column selection circuit electrically connects a plurality of bitline groups of the bitlines to a plurality of input-output lines sequentially based on the latch address signal in the enable mode. The latch circuit receives and stores fuse bits provided sequentially through the bitline groups and the input-output lines in the enable mode.
Public/Granted literature
- US20180108425A1 ONE-TIME PROGRAMMABLE (OTP) MEMORY DEVICE FOR READING MULTIPLE FUSE BITS Public/Granted day:2018-04-19
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