Invention Grant
- Patent Title: Imprint apparatus, foreign particle removal method, and method of manufacturing article
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Application No.: US14561576Application Date: 2014-12-05
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Publication No.: US10201927B2Publication Date: 2019-02-12
- Inventor: Makoto Mizuno , Shinichi Shudo , Tsuyoshi Arai
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Agency: Rossi, Kimms & McDowell LLP
- Priority: JP2013-264502 20131220
- Main IPC: B29C59/02
- IPC: B29C59/02 ; B29C59/00 ; G03F7/00 ; B29L31/00

Abstract:
The present invention provides an imprint apparatus which performs an imprint process of molding an imprint material on a substrate using a mold and forming a pattern on the substrate, the apparatus including a substrate chuck configured to hold the substrate, a protective plate configured to surround the substrate chuck, and a suction mechanism configured to suction at least a part of a gap between the substrate chuck and the protective plate, wherein while the suction mechanism suctions at least the part of the gap, the substrate chuck holds a plate which is different from the substrate on which the pattern is to be formed.
Public/Granted literature
- US20150174816A1 IMPRINT APPARATUS, FOREIGN PARTICLE REMOVAL METHOD, AND METHOD OF MANUFACTURING ARTICLE Public/Granted day:2015-06-25
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