Invention Grant
- Patent Title: Method and device for measuring the thickness of a coating layer on a running strip
-
Application No.: US13701305Application Date: 2011-05-30
-
Publication No.: US10203194B2Publication Date: 2019-02-12
- Inventor: Pierre Gauje
- Applicant: Pierre Gauje
- Applicant Address: ES Sestao, Bizkaia
- Assignee: ARCELORMITTAL INVESTIGACION Y DESARROLLO, S.L.
- Current Assignee: ARCELORMITTAL INVESTIGACION Y DESARROLLO, S.L.
- Current Assignee Address: ES Sestao, Bizkaia
- Agency: Davidson, Davidson & Kappel, LLC
- Priority: WOPCT/FR2010/051046 20100531
- International Application: PCT/FR2011/051232 WO 20110530
- International Announcement: WO2011/151585 WO 20111208
- Main IPC: G01B7/06
- IPC: G01B7/06 ; G01B15/02

Abstract:
A method and device for measuring the thickness of a coating material layer of a running strip according to which, by means of an eddy current sensor for at least one area of the strip, a quantity is measured, representative of the thickness of the coating layer and the thickness of the coating layer is determined from the measured quantity and from at least one calibration value. The measurement made with an eddy current sensor comprises the measurement of the complex impedance of a coil facing the running strip for a low excitation frequency and a high excitation frequency and the elaboration of a quantity representative of the thickness of the coating layer from said complex impedance measurements. A device for applying the method and a coating installation equipped with the device.
Public/Granted literature
- US20130133575A1 METHOD AND DEVICE FOR MEASURING THE THICKNESS OF A COATING LAYER ON A RUNNING STRIP Public/Granted day:2013-05-30
Information query