Invention Grant
- Patent Title: Far-infrared imaging device and far-infrared imaging method
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Application No.: US15100441Application Date: 2015-01-07
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Publication No.: US10203278B2Publication Date: 2019-02-12
- Inventor: Kei Shimura
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2014-026037 20140214
- International Application: PCT/JP2015/050198 WO 20150107
- International Announcement: WO2015/122211 WO 20150820
- Main IPC: G01N21/3581
- IPC: G01N21/3581 ; G01J1/42 ; G01J3/02 ; G01J3/10 ; G01J3/28 ; G01J3/42 ; G01J3/433

Abstract:
Provided are an imaging method and device for imaging using far infrared light that make it possible to quickly image a subject without producing damage or a non-linear phenomenon in the subject. A variable-frequency coherent light source is used, illumination light from the light source is irradiated onto a linear area on an imaging subject, transmitted or reflected light is used to form an image of the imaging subject, a non-linear optical crystal is used for wavelength conversion, and a one-dimensional or two-dimensional array sensor is used to image the imaging subject while the imaging subject is moved in at least one direction.
Public/Granted literature
- US20160299064A1 Far-Infrared Imaging Device and Far-Infrared Imaging Method Public/Granted day:2016-10-13
Information query
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