Invention Grant
- Patent Title: Device, method, and non-transitory recording medium storing program for specifying abnormality-occurrence area of secondary battery system
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Application No.: US15053257Application Date: 2016-02-25
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Publication No.: US10203377B2Publication Date: 2019-02-12
- Inventor: Motohiro Fukuhara
- Applicant: NGK INSULATORS, LTD.
- Applicant Address: JP Nagoya
- Assignee: NGK Insultors, Ltd.
- Current Assignee: NGK Insultors, Ltd.
- Current Assignee Address: JP Nagoya
- Agency: Burr & Brown, PLLC
- Priority: JP2013-180563 20130830
- Main IPC: G01R1/00
- IPC: G01R1/00 ; G01R31/36 ; H02J7/00 ; G01R19/165

Abstract:
An apparatus for specifying an abnormality-occurrence area of a secondary battery system includes an information transmission unit for outputting block voltage values and an average block voltage value, an information acquisition unit for acquiring information about a module accommodating a block that has output a block voltage value when the difference between a reference block voltage value obtained from the correlation between the block voltage value and the average block voltage value and the block voltage value is equal to or greater than a preset voltage threshold, a notification reception unit for receiving a notification about the occurrence of an abnormality in a secondary battery, and a module specification unit for specifying at least the module corresponding to the latest module information as the module in which an abnormality occurred when the notification reception unit receives a notification.
Public/Granted literature
Information query