Invention Grant
- Patent Title: Measurement error correction method and electric component property measurement device
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Application No.: US15255527Application Date: 2016-09-02
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Publication No.: US10203396B2Publication Date: 2019-02-12
- Inventor: Taichi Mori , Satoshi Kageyama
- Applicant: MURATA MANUFACTURING CO., LTD.
- Applicant Address: JP Kyoto-fu
- Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee Address: JP Kyoto-fu
- Agency: Studebaker & Brackett PC
- Priority: JP2014-041184 20140304
- Main IPC: G01R27/28
- IPC: G01R27/28 ; G01R35/00 ; G01R27/32

Abstract:
A likely value is calculated by a maximum-likelihood method for all coefficients of a relative error correction circuit network model derived by assuming that, for all pairs of two ports selected from among signal line ports related to application or detection of a high frequency signal and non signal line ports other than the signal line ports, there exists a leak signal directly transferred between the ports. A coefficient of a first relative error correction circuit network submodel derived by assuming that, for all pairs of two ports selected only from among signal line ports, there exists a leak signal directly transferred between the ports, and a coefficient for a non signal line port of a second relative error correction circuit network submodel derived by assuming that there exists a signal reflected at a non signal line port are used as initial values.
Public/Granted literature
- US20160370448A1 MEASUREMENT ERROR CORRECTION METHOD AND ELECTRIC COMPONENT PROPERTY MEASUREMENT DEVICE Public/Granted day:2016-12-22
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