• Patent Title: Exposure apparatus and device manufacturing method having lower scanning speed to expose peripheral shot area
  • Application No.: US13713416
    Application Date: 2012-12-13
  • Publication No.: US10203608B2
    Publication Date: 2019-02-12
  • Inventor: Hiroyuki Nagasaka
  • Applicant: NIKON CORPORATION
  • Applicant Address: JP Tokyo
  • Assignee: NIKON CORPORATION
  • Current Assignee: NIKON CORPORATION
  • Current Assignee Address: JP Tokyo
  • Agency: Oliff PLC
  • Priority: JP2003-297507 20030821; JP2004-038411 20040216
  • Main IPC: G03F7/20
  • IPC: G03F7/20
Exposure apparatus and device manufacturing method having lower scanning speed to expose peripheral shot area
Abstract:
An exposure apparatus includes a substrate stage having a substrate holder to hold a substrate, a gap being formed between an edge of the held substrate and a surface surrounding the held substrate, and a controller that controls an exposure operation in which shot areas of the substrate are exposed sequentially and respectively with an image through liquid of a liquid immersion area which covers a portion of an upper surface of the substrate. The controller moves the substrate stage at a first speed to expose one of the shot areas to the image through the liquid, moves the substrate stage at a second speed, that is lower than the first speed, to expose another one of the shot areas to the image through the liquid, and during the exposing of the another one of the shot areas, the liquid immersion area is formed over a portion of the gap.
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