- Patent Title: Defect classification apparatus and defect classification method
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Application No.: US14360636Application Date: 2012-11-26
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Publication No.: US10203851B2Publication Date: 2019-02-12
- Inventor: Yohei Minekawa , Yuji Takagi , Minoru Harada , Takehiro Hirai , Ryo Nakagaki
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Miles & Stockbridge P.C.
- Priority: JP2011-287369 20111228
- International Application: PCT/JP2012/080416 WO 20121126
- International Announcement: WO2013/099487 WO 20130704
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G02B21/36 ; G06F17/30 ; G06F9/451 ; G06F3/0484 ; H01J37/26

Abstract:
Provided is a GUI including: an unadded pane region that hierarchically displays folders which are sets of images having no class information added thereto; an image pane region that displays the images displayed in the unadded pane region, the displayed images having no classification added thereto; and a class pane region that displays images having classification added thereto, wherein by externally inputting class information for one image having the class information added thereto, the input class information is displayed.
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