- Patent Title: Error detection circuit and semiconductor apparatus using the same
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Application No.: US14711491Application Date: 2015-05-13
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Publication No.: US10204005B2Publication Date: 2019-02-12
- Inventor: Jin Youp Cha , Yu Ri Lim
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si, Gyeonggi-do
- Assignee: Sk hynix Inc.
- Current Assignee: Sk hynix Inc.
- Current Assignee Address: KR Icheon-si, Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: KR10-2015-0028589 20150227
- Main IPC: G06F11/08
- IPC: G06F11/08 ; G11C17/16 ; G11C17/18 ; G11C29/02 ; G06F11/32

Abstract:
An error detection circuit may include a selection unit that sequentially selects a primary data group and a secondary data group according to a first control signal and generates an output signal; a first operation unit that performs an error detection operation on the output signal and outputs a preliminary error operation signal; a storage unit that latches the preliminary error operation signal and output a latched signal according to a second control signal; a second operation unit that performs an error detection operation on a previous preliminary error operation signal outputted from the storage unit and a current preliminary error operation signal outputted from the first operation unit and generates an internal error operation signal; and a comparison unit that compares the internal error operation signal with an external error operation signal and outputs a result of the comparison as an error detection signal.
Public/Granted literature
- US20160253228A1 ERROR DETECTION CIRCUIT AND SEMICONDUCTOR APPARATUS USING THE SAME Public/Granted day:2016-09-01
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