Invention Grant
- Patent Title: Wafer de-bonding device
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Application No.: US15534196Application Date: 2015-07-16
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Publication No.: US10204813B2Publication Date: 2019-02-12
- Inventor: Ming Yin , Hao Tang
- Applicant: Zhejiang Microtech Material Co., Ltd.
- Applicant Address: CN Zhejiang
- Assignee: Zhejiang Microtech Material Co., Ltd.
- Current Assignee: Zhejiang Microtech Material Co., Ltd.
- Current Assignee Address: CN Zhejiang
- Agency: Radlo IP Law Group
- Agent Peter Su
- Priority: CN201510404757 20150708
- International Application: PCT/CN2015/084182 WO 20150716
- International Announcement: WO2017/004843 WO 20170112
- Main IPC: B32B43/00
- IPC: B32B43/00 ; H01L21/683 ; H01L21/67 ; H01L21/687 ; B32B38/10

Abstract:
A wafer de-bonding device comprises a stage (1) for holding a device wafer and a carrier wafer bonded together, and a tool (2) with a gas outlet (2.2) disposed in proximity to the stage (1) through an adjustment device for control the tool (2) to move towards or away from the stage (1), the tool (2) being provided with a bit (2.1) to cut a notch into a film or an adhesive layer at a junction of the bonded wafers, the gas outlet (2.2) being provided on the tool bit (2.1), the tool (2) being further provided with a gas inlet (2.3) in communication with the gas outlet (2.2), the gas inlet (2.3) being connected to a gas jet generator so as to direct a gas jet towards the junction of the bonded wafers on the stage (2). The wafer de-bonding device has a high degree of automation and simple operations.
Public/Granted literature
- US20180108558A1 WAFER DE-BONDING DEVICE Public/Granted day:2018-04-19
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