Invention Grant
- Patent Title: Ultrasonic testing device and ultrasonic testing method
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Application No.: US15116886Application Date: 2015-01-30
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Publication No.: US10209228B2Publication Date: 2019-02-19
- Inventor: Shigeru Oono , Kenta Sumikawa
- Applicant: Hitachi Power Solutions Co., Ltd.
- Applicant Address: JP Hitachi-shi
- Assignee: Hitachi Power Solutions Co., Ltd.
- Current Assignee: Hitachi Power Solutions Co., Ltd.
- Current Assignee Address: JP Hitachi-shi
- Agency: Crowell & Moring LLP
- Priority: JP2014-020907 20140206
- International Application: PCT/JP2015/052750 WO 20150130
- International Announcement: WO2015/119063 WO 20150813
- Main IPC: G01N29/24
- IPC: G01N29/24 ; G01N29/26 ; G01N29/22 ; G01N29/28

Abstract:
The invention is applied to an ultrasound inspection apparatus including an array probe such that wetting is substantially limited to an inspection surface of the work. The ultrasound inspection apparatus includes: a work holder that holds a work with an inspection surface thereof facing downward; an array probe that probes the work with an ultrasonic wave; a water tank in which the array probe is immersed in water; an arm that holds the array probe such that the array probe faces an underside of the inspection surface of the work; X-axial direction scanning means that horizontally scans the work, with a liquid surface coming into contact with the inspection surface of the work due to surface tension of a liquid stored in the water tank; and Y-axial direction scanning means that horizontally scans the array probe.
Public/Granted literature
- US20170176397A1 Ultrasonic Testing Device and Ultrasonic Testing Method Public/Granted day:2017-06-22
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