Invention Grant
- Patent Title: X-ray data processing apparatus, X-ray data processing method, and X-ray data processing program
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Application No.: US14163608Application Date: 2014-01-24
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Publication No.: US10209375B2Publication Date: 2019-02-19
- Inventor: Kazuyuki Matsushita , Takuto Sakumura , Yasukazu Nakaye
- Applicant: Rigaku Corporation
- Applicant Address: JP Akishima-Shi
- Assignee: RIGAKU CORPORATION
- Current Assignee: RIGAKU CORPORATION
- Current Assignee Address: JP Akishima-Shi
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2013-029782 20130219
- Main IPC: G01T7/00
- IPC: G01T7/00 ; G01T1/29 ; G01N23/087

Abstract:
An X-ray data processing apparatus for processing X-ray data that is obtained by simultaneously measuring X-rays of multiple wavelengths. The apparatus includes a management unit 210 to receive and manage X-ray data that is detected by a detector, a calculation unit 230 which calculates a detection amount of charge sharing events in lower energy side data caused by higher energy X-ray, based on the higher energy side data obtained using a threshold value on a higher energy side and the lower energy side data obtained using a threshold value on a lower energy side of the received X-ray data, and a correction unit 250 to reconfigure the lower energy side data using the calculated detection amount. The apparatus can remove a residual image of an X-ray on a higher energy side which remains in data on a lower energy side.
Public/Granted literature
- US20140236523A1 X-RAY DATA PROCESSING APPARATUS, X-RAY DATA PROCESSING METHOD, AND X-RAY DATA PROCESSING PROGRAM Public/Granted day:2014-08-21
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