Invention Grant
- Patent Title: Plasma processing apparatus and plasma processing method
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Application No.: US14576424Application Date: 2014-12-19
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Publication No.: US10211031B2Publication Date: 2019-02-19
- Inventor: Chishio Koshimizu , Jun Yamawaku
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Rothwell, Figg, Ernst & Manbeck, P.C.
- Priority: JP2013-263996 20131220
- Main IPC: H01J37/32
- IPC: H01J37/32

Abstract:
Disclosed is a plasma processing method for generating plasma between an upper electrode connected with a VF power supply and a susceptor disposed to face the upper electrode to perform a plasma processing on a wafer by the plasma. The plasma processing method includes: providing an auxiliary circuit configured to reduce a difference between a reflection minimum frequency of a first route where a high frequency current generated from the VF power supply flows before ignition of the plasma and a reflection minimum frequency of a second route where the high frequency current generated from the VF power supply flows after the ignition of the plasma; igniting the plasma; and maintaining the plasma.
Public/Granted literature
- US20150179407A1 PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD Public/Granted day:2015-06-25
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