Invention Grant
- Patent Title: Non-contact voltage measurement device
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Application No.: US15119400Application Date: 2015-02-04
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Publication No.: US10215779B2Publication Date: 2019-02-26
- Inventor: Hiroshi Imai , Keiki Matsuura , Hiroyuki Tokusaki , Mao Ogimoto
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto-shi
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto-shi
- Agency: Metrolexis Law Group, PLLC
- Priority: JP2014-050655 20140313
- International Application: PCT/JP2015/053149 WO 20150204
- International Announcement: WO2015/137018 WO 20150917
- Main IPC: G01R15/16
- IPC: G01R15/16 ; G01R1/07 ; G01R1/18

Abstract:
There is provided a non-contact voltage measurement device which can precisely measure a measurement target voltage by suppressing a flow of a leakage current via a parasitic capacitance produced between an electric field shield and an electric circuit. A drive voltage applying unit applies a voltage generated from an output voltage of a low impedance unit of the electric circuit and equal to an input voltage of a high impedance unit, to a first electric field shield coated on the high impedance unit.
Public/Granted literature
- US20170059619A1 NON-CONTACT VOLTAGE MEASUREMENT DEVICE Public/Granted day:2017-03-02
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