Invention Grant
- Patent Title: Vibration analyzing system, vibration analyzing apparatus, and vibration analyzing method
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Application No.: US15384693Application Date: 2016-12-20
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Publication No.: US10215867B2Publication Date: 2019-02-26
- Inventor: Masayuki Oto
- Applicant: Seiko Epson Corporation
- Applicant Address: JP
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2015-256062 20151228
- Main IPC: G01V1/30
- IPC: G01V1/30 ; G01V1/00

Abstract:
A vibration analyzing apparatus includes a vibration detecting unit set in a building where a person can reside and configured to detect vibration and output a detection signal based on the detected vibration, a mode determining unit configured to determine presence or absence of vibration of the building caused by an earthquake, and a control unit including a vibration analyzing unit configured to analyze the vibration on the basis of the detection signal, the control unit setting an analysis mode of the vibration analyzing unit. The control unit sets one of a normal time analysis mode for causing the vibration analyzing unit to analyze a vibration waveform indicated by the detection signal on the basis of a first condition and obtaining information concerning residence of the person and an earthquake analysis mode for obtaining information concerning deformation of the building.
Public/Granted literature
- US20170184741A1 VIBRATION ANALYZING SYSTEM, VIBRATION ANALYZING APPARATUS, AND VIBRATION ANALYZING METHOD Public/Granted day:2017-06-29
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