Invention Grant
- Patent Title: Automated defect diagnosis from machine diagnostic data
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Application No.: US14997980Application Date: 2016-01-18
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Publication No.: US10223185B2Publication Date: 2019-03-05
- Inventor: Mark Chamness , Eric Schnegelberger
- Applicant: EMC Corporation
- Applicant Address: US MA Hopkinton
- Assignee: EMC IP Holding Company LLC
- Current Assignee: EMC IP Holding Company LLC
- Current Assignee Address: US MA Hopkinton
- Agency: Womble Bond Dickinson (US) LLP
- Main IPC: G06F11/07
- IPC: G06F11/07 ; H04L12/24

Abstract:
Diagnosis of defect(s) in a system is disclosed. A defect signature-based query is performed against system diagnostic data stored in one or more structured records. It is determined that a defect signature is associated with a system based at least in part on the query. Remediation information generated based at least in part on the defect signature and the system diagnostic data may be output.
Public/Granted literature
- US20160132377A1 AUTOMATED DEFECT DIAGNOSIS FROM MACHINE DIAGNOSTIC DATA Public/Granted day:2016-05-12
Information query