- Patent Title: Apparatuses and methods for indirectly detecting phase variations
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Application No.: US15660405Application Date: 2017-07-26
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Publication No.: US10224938B2Publication Date: 2019-03-05
- Inventor: Hiroki Takahashi
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: H03L7/06
- IPC: H03L7/06 ; H03L7/081 ; H03L7/091

Abstract:
Apparatuses and methods for indirect phase variation detection are disclosed herein. An example apparatus may include a clock generator circuit comprising a delay-locked loop (DLL) circuit configured to adjust a phase of a clock signal based on a phase of a feedback clock signal during an initial phase-lock operation. The DLL circuit includes a phase deviation detection circuit configured to detect a variation in a phase of the clock signal based on variations in gate delays of an oscillation circuit, and to initiate a subsequent phase-lock operation in response to detecting variations in the gate delays of the oscillation circuit.
Public/Granted literature
- US20190036535A1 APPARATUSES AND METHODS FOR INDIRECTLY DETECTING PHASE VARIATIONS Public/Granted day:2019-01-31
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